Impact Factor 3.84         Index Copernicus (IC) Value: 5.18

Ediitor in Chief

Dr. Tan received his Ph.D in Electrical Engineering from the University of Toronto in 1992. He has 10 years of working experiences in reliability in electronic industry (both Singapore and Taiwan) before joining Nanyang Technological University (NTU) as faculty member in 1996 till 2014. He is now with Chang Gung University, Taiwan as Professor and Director of Reliability Science and Technologies. He has published more than 240 International Journal and Conference papers, and holding 10 patents and 1 copyright for reliability software. He has given more than 25 invited talks in International Conferences. He has written 3 books and 3 book chapters in the field of reliability. He is also the Series Editor of SpringerBrief in Reliability. He is the past chair of IEEE Singapore Section, Senior member of IEEE and ASQ, Distinguish Lecturer of IEEE Electronic Device Society on reliability, Founding Chair of IEEE Nanotechnology Chapter - Singapore Section, Fellow of Institute of Engineers, Singapore, and Fellow of Singapore Quality Institute. He is an Editor of IEEE TDMR, associated Editor of International Journal on Computing, and Guest Editor of International J. of Nanotechnology, Nano-research letter and Microelectronic Reliability. His research interests include reliability and failure physics modeling of electronic components and systems, finite element modeling of materials degradation, statistical modeling of engineering systems, nano-materials and devices reliability, and prognosis & health management of engineering system.